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Chulcova, G. M.; Ptitsina, N. G.; Gershenzon, E. M.; Gershenzon, M. E.; Sergeev, A. V. Effect of the interference between electron-phonon and electron-impurity (boundary) scattering on resistivity Nb, Al, Be films 1996 Czech J. Phys. 46 2489-2490 details   doi
Maslennikov, S. N.; Morozov, D. V.; Ozhegov, R. V.; Smirnov, K. V.; Okunev, O. V.; Gol’tsman, G. N. Imaging system for submillimeter wave range based on AlGaAs/GaAs hot electron bolometer mixers 2004 Proc. 5-th MSMW 2 558-560 details   doi
Shangina, E. L.; Smirnov, K. V.; Morozov, D. V.; Kovalyuk, V. V.; Goltsman, G. N.; Verevkin, A. A.; Toropov, A. I.; Mauskopf, P. Concentration dependence of energy relaxation time in AlGaAs/GaAs heterojunctions: direct measurements 2011 Semicond. Sci. Technol. 26 025013 details   doi
Schwaab, G. W.; Hübers, H.-W.; Schubert, J.; Erichsen, Patrik; Gol'tsman, G.; Semenov, A.; Verevkin, A.; Cherednichenko, S.; Gershenzon, E. A high resolution spectrometer for the investigation of molecular structures in the THZ range 1999 Proc. 10th Int. Symp. Space Terahertz Technol. 530-538 details   url
Kardakova, A.; Shishkin, A.; Semenov, A.; Goltsman, G. N.; Ryabchun, S.; Klapwijk, T. M.; Bousquet, J.; Eon, D.; Sacépé, B.; Klein, T.; Bustarret, E. Relaxation of the resistive superconducting state in boron-doped diamond films 2016 Phys. Rev. B 93 064506 details   doi
Zubkova, E.; An, P.; Kovalyuk, V.; Korneev, A.; Ferrari, S.; Pernice, W.; Goltsman, G. Optimization of contra-directional coupler based on silicon nitride Bragg rib waveguide 2018 J. Phys.: Conf. Ser. 1124 051048 details   doi
Zubkova, E.; An, P.; Kovalyuk, V.; Korneev, A.; Goltsman, G. Integrated Bragg waveguides as an efficient optical notch filter on silicon nitride platform 2017 Proc. SPBOPEN 449-450 details   url
Komrakova, S.; Javadzade, J.; Vorobyov, V.; Bolshedvorskii, S.; Soshenko, V.; Akimov, A.; Kovalyuk, V.; Korneev, A.; Goltsman, G. CMOS compatible nanoantenna-nanodiamond integration 2019 J. Phys.: Conf. Ser. 1410 012180 details   doi
Гершензон, Е. М.; Гольцман, Г. Н.; Елантьев, А. И.; Кагане, М. Л.; Мултановский, В. В.; Птицина, Н. Г. Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках 1983 Физика и техника полупроводников 17 1430-1437 details   url
Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors 1983 Sov. Phys. Semicond. 17 908-913 details   url
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