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Driessen, E. F. C.; Braakman, F. R.; Reiger, E. M.; Dorenbos, S. N.; Zwiller, V.; de Dood, M. J. A. Impedance model for the polarization-dependent optical absorption of superconducting single-photon detectors 2009 Eur. Phys. J. Appl. Phys. 47 10701 details   doi
Hu, Xiaolong; Zhong, Tian; White, James E.; Dauler, Eric A. Najafi, Faraz; Herder, Charles H.; Wong, Franco N. C.; Berggren, Karl K. Fiber-coupled nanowire photon counter at 1550 nm with 24% system detection efficiency 2009 Optics Letters 34 3607-3609 details   openurl
Khosropanah P.; Baryshev A.; Zhang W.; Jellema W.; Hovenier J.N.; Gao G.R.; Klapwijk T.M; Paveliev D.G.; Williams B.S.; Kumar S.; Hu Q.; Reno J.L.; Klein B.; Hesler J.L. Phase-locking of a 2.7-THz quantum cascade laser to a microwave reference 2009 Optics Letters 34 2958-2960 details   openurl
Venkatasubramanian, Chandrasekaran; Cabarcos, Orlando M.; Allara, David L. Horn, Mark W.; Ashok, S. Correlation of temperature response and structure of annealed VOx thin films for IR detector applications 2009 J. Vac. Sci. Technol. A 27 6 details   openurl
Wild, W.; Kardashev, N. S.; Likhachev, S. F.; Babakin, N. G.; Arkhipov, V. Y.; Vinogradov, I. S.; Andreyanov, V. V.; Fedorchuk, S. D.; Myshonkova, N. V.; Alexsandrov, Y. A.; Novokov, I. D.; Goltsman, G. N.; Cherepaschuk, A. M.; Shustov, B. M.; Vystavkin, A. N.; Koshelets, V. P.; Vdovin, V.F.; de Graauw, T.; Helmich, F.; vd Tak, F.; Shipman, R.; Baryshev, A.; Gao, J. R.; Khosropanah, P.; Roelfsema, P.; Barthel, P.; Spaans, M.; Mendez, M.; Klapwijk, T.; Israel, F.; Hogerheijde, M.; vd Werf, P.; Cernicharo, J.; Martin-Pintado, J.; Planesas, P.; Gallego, J. D.; Beaudin, G.; Krieg, J. M.; Gerin, M.; Pagani, L.; Saraceno, P.; Di Giorgio, A. M.; Cerulli, R.; Orfei, R.; Spinoglio, L.; Piazzo, L.; Liseau, R.; Belitsky, V.; Cherednichenko, S.; Poglitsch, A.; Raab, W.; Guesten, R.; Klein, B.; Stutzki, J.; Honingh, N.; Benz, A.; Murphy, A.; Trappe, N.; Räisänen, A. Millimetron—a large Russian-European submillimeter space observatory 2009 Exp. Astron. 23 221-244 details   doi
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