Records |
Author |
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Title |
ГОСТ 19.401-78. ЕСПД. Текст программы. Требования к содержанию и оформлению |
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Book Whole |
Year |
1983 |
Publication |
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Issue |
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Pages |
1 |
Keywords |
gost, detproj |
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no |
Call Number |
RPLAB @ s @ |
Serial |
891 |
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Author |
Feldman, M. J.; Rudner, S. |
Title |
Mixing with SIS arrays |
Type |
Journal Article |
Year |
1983 |
Publication |
Reviews of Infrared and Millimeter-Waves |
Abbreviated Journal |
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Volume |
1 |
Issue |
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Pages |
47 |
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no |
Call Number |
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Serial |
232 |
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Author |
Гершензон, Е. М.; Гольцман, Г. Н.; Елантьев, А. И.; Кагане, М. Л.; Мултановский, В. В.; Птицина, Н. Г. |
Title |
Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках |
Type |
Journal Article |
Year |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
Volume |
17 |
Issue |
8 |
Pages |
1430-1437 |
Keywords |
BWO spectroscopy, pure semiconductors, residual impurities |
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Russian |
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Duplicated as 1714 |
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Serial |
1712 |
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Author |
Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. |
Title |
Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors |
Type |
Journal Article |
Year |
1983 |
Publication |
Sov. Phys. Semicond. |
Abbreviated Journal |
Sov. Phys. Semicond. |
Volume |
17 |
Issue |
8 |
Pages |
908-913 |
Keywords |
BWO spectroscopy, pure semiconductors, residual impurities |
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Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках |
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Serial |
1714 |
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Author |
Банная, В. Ф.; Веселова, Л. И.; Гершензон, Е. М. |
Title |
Об одном способе определения концентрации глубоких примесей в германии |
Type |
Journal Article |
Year |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
Volume |
17 |
Issue |
10 |
Pages |
1896-1898 |
Keywords |
Ge, deep impurities |
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no |
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Serial |
1762 |
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