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Author Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. url  openurl
  Title Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors Type Journal Article
  Year 1983 Publication Sov. Phys. Semicond. Abbreviated Journal Sov. Phys. Semicond.  
  Volume (down) 17 Issue 8 Pages 908-913  
  Keywords BWO spectroscopy, pure semiconductors, residual impurities  
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  Notes Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках Approved no  
  Call Number Serial 1714  
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Author Банная, В. Ф.; Веселова, Л. И.; Гершензон, Е. М. url  openurl
  Title Об одном способе определения концентрации глубоких примесей в германии Type Journal Article
  Year 1983 Publication Физика и техника полупроводников Abbreviated Journal Физика и техника полупроводников  
  Volume (down) 17 Issue 10 Pages 1896-1898  
  Keywords Ge, deep impurities  
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  Notes Approved no  
  Call Number Serial 1762  
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Author Гершензон, Е. М.; Литвак-Горская, Л. Б.; Рабинович, Р. И. url  openurl
  Title Отрицательное магнитосопротивление в случае проводимости по верхней зоне Хаббарда Type Journal Article
  Year 1983 Publication Физика и техника полупроводников Abbreviated Journal Физика и техника полупроводников  
  Volume (down) 17 Issue 10 Pages 1873-1876  
  Keywords compensated n-InSb, Hubbard upper zone conductivity, negative magnetoresistance  
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  Notes Approved no  
  Call Number Serial 1763  
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Author Гершензон, Е. М.; Мельников, А. П.; Рабинович, Р. И.; Смирнова, В. Б. url  openurl
  Title О возможности создания инверсной функции распределения свободных носителей в полупроводниках при захвате на мелкие нейтральные примеси Type Journal Article
  Year 1983 Publication Физика и техника полупроводников Abbreviated Journal Физика и техника полупроводников  
  Volume (down) 17 Issue 3 Pages 499-501  
  Keywords shallow neutral impurities, capture, inverse distribution function, Si  
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  Notes Approved no  
  Call Number Serial 1764  
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Author Vetter, A.; Ferrari, S.; Rath, P.; Alaee, R.; Kahl, O.; Kovalyuk, V.; Diewald, S.; Goltsman, G. N.; Korneev, A.; Rockstuhl, C.; Pernice, W. H. P. url  doi
openurl 
  Title Cavity-enhanced and ultrafast superconducting single-photon detectors Type Journal Article
  Year 2016 Publication Nano Lett. Abbreviated Journal Nano Lett.  
  Volume (down) 16 Issue 11 Pages 7085-7092  
  Keywords SSPD; SNSPD; multiphoton detection; nanophotonic circuit; photonic crystal cavity  
  Abstract Ultrafast single-photon detectors with high efficiency are of utmost importance for many applications in the context of integrated quantum photonic circuits. Detectors based on superconductor nanowires attached to optical waveguides are particularly appealing for this purpose. However, their speed is limited because the required high absorption efficiency necessitates long nanowires deposited on top of the waveguide. This enhances the kinetic inductance and makes the detectors slow. Here, we solve this problem by aligning the nanowire, contrary to usual choice, perpendicular to the waveguide to realize devices with a length below 1 mum. By integrating the nanowire into a photonic crystal cavity, we recover high absorption efficiency, thus enhancing the detection efficiency by more than an order of magnitude. Our cavity enhanced superconducting nanowire detectors are fully embedded in silicon nanophotonic circuits and efficiently detect single photons at telecom wavelengths. The detectors possess subnanosecond decay ( approximately 120 ps) and recovery times ( approximately 510 ps) and thus show potential for GHz count rates at low timing jitter ( approximately 32 ps). The small absorption volume allows efficient threshold multiphoton detection.  
  Address Institute of Physics, University of Munster , 48149 Munster, Germany  
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  Language English Summary Language Original Title  
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  ISSN 1530-6984 ISBN Medium  
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  Notes PMID:27759401 Approved no  
  Call Number Serial 1208  
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