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Zhang J, Boiadjieva N, Chulkova G, Deslandes H, Gol'tsman GN, Korneev A, et al. Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors. Electron Lett. 2003;39(14):1086–8.
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Kitaygorsky J, Zhang J, Verevkin A, Sergeev A, Korneev A, Matvienko V, et al. Origin of dark counts in nanostructured NbN single-photon detectors. IEEE Trans Appl Supercond. 2005;15(2):545–8.
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Pearlman A, Cross A, Slysz W, Zhang J, Verevkin A, Currie M, et al. Gigahertz counting rates of NbN single-photon detectors for quantum communications. IEEE Trans Appl Supercond. 2005;15(2):579–82.
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Lipatov A, Okunev O, Smirnov K, Chulkova G, Korneev A, Kouminov P, et al. An ultrafast NbN hot-electron single-photon detector for electronic applications. Supercond Sci Technol. 2002;15(12):1689–92.
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Gol’tsman GN, Smirnov K, Kouminov P, Voronov B, Kaurova N, Drakinsky V, et al. Fabrication of nanostructured superconducting single-photon detectors. IEEE Trans Appl Supercond. 2003;13(2):192–5.
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Zhang J, Pearlman A, Slysz W, Verevkin A, Sobolewski R, Wilsher K, et al. A superconducting single-photon detector for CMOS IC probing. In: Proc. 16-th LEOS. Vol 2.; 2003. p. 602–3.
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Pan SK, A. R. Kerr MWP, Lauria EF, Crady WK, Horner N, Srikanth JS, et al. A fixed-tuned integrated SIS mixer with ultra-wideband IF and quantum-limited sensitivity for ALMA band 3 (84-116 GHz) receivers. In: Proc. 15th Int. Symp. Space Terahertz Technol. ; 2004. p. 55–61.
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Verevkin A, Slysz W, Pearlman A, Zhang J, Sobolewski R, Okunev O, et al. Real-time GHz-rate counting of infrared photons using nanostructured NbN superconducting detectors. In: CLEO/QELS. Optical Society of America; 2003. CThM8.
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Verevkin A, Zhang J, Slysz W, Sobolewski R, Lipatov A, Okunev O, et al. Spectral sensitivity and temporal resolution of NbN superconducting single-photon detectors. In: Proc. 13th Int. Symp. Space Terahertz Technol.; 2002. p. 105–11.
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Zhang J, Pearlman A, Slysz W, Verevkin A, Sobolewski R, Okunev O, et al. Infrared picosecond superconducting single-photon detectors for CMOS circuit testing. In: CLEO/QELS. Optical Society of America; 2003. Cmv4.
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