| Records |
| Author |
Гершензон, Е. М.; Гольцман, Г. Н.; Елантьев, А. И.; Кагане, М. Л.; Мултановский, В. В.; Птицина, Н. Г. |
| Title |
Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках |
Type |
Journal Article |
Year  |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
| Volume |
17 |
Issue |
8 |
Pages |
1430-1437 |
| Keywords |
BWO spectroscopy, pure semiconductors, residual impurities |
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Russian |
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Duplicated as 1714 |
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1712 |
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| Author |
Gershenzon, E. M.; Gol'tsman, G. N.; Semenov, A. D. |
| Title |
Submillimeter backward wave tube spectrometer for measuring superconducting film transmission |
Type |
Journal Article |
| Year |
1983 |
Publication |
Pribory i Tekhnika Eksperimenta |
Abbreviated Journal |
Pribory i Tekhnika Eksperimenta |
| Volume |
26 |
Issue |
5 |
Pages |
134-137 |
| Keywords |
BWO spectroscopy, spectrometer, transmission |
| Abstract |
A spectrometer employing six backward wave tubes is described. It is intended for investigation of superconductors in the 0.2-3 mm range of wave lengths. During the measurement of the transmission spectrum it is possible to determine the energy gap for superconduct1ng films 50 to 4000 A thick. The transmission factor can vary from 10-1 to 10-9. Spectrum of relation of film transmission factors in superconducting and normal states is measured for determining the energy gap 2 Δ. The transmission spectrum obtained by means of a computer for vanadium film 300 A thick is given as an example. The energy gap 2 Δ = 1.4 MeV |
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Russian |
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0032-8162 |
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| Notes |
Субмиллиметровый спектрометр с лампами обратной волны для измерения пропускания сверхпроводниковых пленок |
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1713 |
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| Author |
Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. |
| Title |
Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors |
Type |
Journal Article |
| Year |
1983 |
Publication |
Sov. Phys. Semicond. |
Abbreviated Journal |
Sov. Phys. Semicond. |
| Volume |
17 |
Issue |
8 |
Pages |
908-913 |
| Keywords |
BWO spectroscopy, pure semiconductors, residual impurities |
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Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках |
Approved |
no |
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Serial |
1714 |
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| Author |
Банная, В. Ф.; Веселова, Л. И.; Гершензон, Е. М. |
| Title |
Об одном способе определения концентрации глубоких примесей в германии |
Type |
Journal Article |
| Year |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
| Volume |
17 |
Issue |
10 |
Pages |
1896-1898 |
| Keywords |
Ge, deep impurities |
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1762 |
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| Author |
Гершензон, Е. М.; Литвак-Горская, Л. Б.; Рабинович, Р. И. |
| Title |
Отрицательное магнитосопротивление в случае проводимости по верхней зоне Хаббарда |
Type |
Journal Article |
| Year |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
| Volume |
17 |
Issue |
10 |
Pages |
1873-1876 |
| Keywords |
compensated n-InSb, Hubbard upper zone conductivity, negative magnetoresistance |
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1763 |
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