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Банная, В. Ф.; Веселова, Л. И.; Гершензон, Е. М. |
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Об одном способе определения концентрации глубоких примесей в германии |
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Year |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
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17 |
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10 |
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1896-1898 |
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Keywords |
Ge, deep impurities |
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1762 |
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Гершензон, Е. М.; Гольцман, Г. Н.; Елантьев, А. И.; Кагане, М. Л.; Мултановский, В. В.; Птицина, Н. Г. |
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Title |
Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках |
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Journal Article |
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Year |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
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Volume |
17 |
Issue |
8 |
Pages |
1430-1437 |
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Keywords |
BWO spectroscopy, pure semiconductors, residual impurities |
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Russian |
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Duplicated as 1714 |
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no |
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1712 |
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Author |
Гершензон, Е. М.; Литвак-Горская, Л. Б.; Рабинович, Р. И. |
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Title |
Отрицательное магнитосопротивление в случае проводимости по верхней зоне Хаббарда |
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Journal Article |
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Year |
1983 |
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Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
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Volume |
17 |
Issue |
10 |
Pages |
1873-1876 |
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Keywords |
compensated n-InSb, Hubbard upper zone conductivity, negative magnetoresistance |
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1763 |
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Гершензон, Е. М.; Мельников, А. П.; Рабинович, Р. И.; Смирнова, В. Б. |
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Title |
О возможности создания инверсной функции распределения свободных носителей в полупроводниках при захвате на мелкие нейтральные примеси |
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Year |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
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Volume |
17 |
Issue |
3 |
Pages |
499-501 |
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Keywords |
shallow neutral impurities, capture, inverse distribution function, Si |
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1764 |
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